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In this article we report the evaluation of thick (up to 10 mm) as-grown Cd0.9Zn0.1Te(CZT):In detectors fabricated from ingots grown by traveling heater method (THM). The crystals were investigated by mapping the electron mobility (μe), (μτ)e and the internal electric field of as-grown CZT samples. The detector performance was also evaluated in co-planar grid geometry. The excellent (μτ)e value and the detector performance of 10 mm thick as-grown detectors is the indication that the THM technique can be employed successfully to fabricate the detectors directly from the as-grown boule at substantially lower cost.