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A 5.4 Gb/s clock and data recovery circuit using the seamless loop transition scheme without phase noise degradation

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2 Author(s)
Won-Young Lee ; Dept. of Electr. Engeering, KAIST, Daejeon, South Korea ; Lee-Sup Kim

This paper presents a 5.4 Gb/s clock and data recovery circuit using the seamless loop transition scheme which has no phase noise degradation. The controllable loop filter enables the CDR circuit to change the operation mode without the output phase noise degradation and the stability problem. The modified half-rate linear phase detector reduces the phase error between the data and clock. A tested chip is manufactured using 0.13 μm CMOS technology. The RMS jitter of the proposed CDR circuit is 5.98 ps-rms, which is 2.61 ps lower than the CDR circuit with the conventional scheme. The measured power dissipation is 138 mW with off-chip drivers at 5.4 Gb/s data rate.

Published in:

Circuits and Systems (ISCAS), 2011 IEEE International Symposium on

Date of Conference:

15-18 May 2011