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Generally, in the studies of microelectronics engineer the approach of IC testing remains very theoretical. Only few concrete practices are commonly done and generally laboratory experiences are limited to the use of CAD tools. For this purpose, in our teaching department, we develop an experiment allowing a concrete learning of IC testing dedicated to the test of commercial memory chips. Through this environment, our students reached a better knowledge of the connection between the test sequences and the detected faults.
Date of Conference: 5-6 June 2011