Close category search window
 

Switch-and-stay partial relay selection over rayleigh fading channels

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Gharanjik, A. ; Fac. of Electr. & Comput. Eng., K.N. Toosi Univ. of Technol., Tehran, Iran ; Mohamed-pour, K.

In this study, a switch-and-stay partial relay selection (SS-PRS) scheme is analysed, where only a single relay from two cooperating open-form decode-and-forward (DF) relays is active in each transmission time slot. The performance of the proposed relay selection scheme is presented in terms of the outage probability and the average bit error rate (ABER). In this study, closed-form expressions are derived for the outage probability and the ABER of the system. In addition, an optimum threshold for the relay switching is found in a minimum ABER sense for the binary phase-shift keying modulation. The numerical and analytical results show that the SS-PRS scheme and the conventional PRS scheme give almost the same performance, whereas the SS-PRS has the advantage of notably lower complexity.

Published in:
Communications, IET  (Volume:5 ,  Issue: 9 )

Date of Publication: June 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.