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Analysis of Residue Integration Sampling With Improved Jitter Immunity

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4 Author(s)
Taehwan Oh ; Sch. of Electr. Eng. & Comput. Sci., Oregon State Univ., Corvallis, OR, USA ; Maghari, N. ; Gubbins, D. ; Un-Ku Moon

The improved jitter immunity of window residue sampling (WRS) is analyzed in this brief. We build a mathematical model for WRS and compare the signal-to-noise ratio performance with the conventional impulse and integration sampling methods. Simulation results show that WRS has better jitter immunity of approximately 3 dB compared with conventional impulse sampling at the Nyquist input frequency.

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Circuits and Systems II: Express Briefs, IEEE Transactions on  (Volume:58 ,  Issue: 7 )