Cart (Loading....) | Create Account
Close category search window
 

Design of Optical XOR, XNOR, NAND, and OR Logic Gates Based on Multi-Mode Interference Waveguides for Binary-Phase-Shift-Keyed Signal

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Ishizaka, Y. ; Grad. Sch. of Inf. Sci. & Technol., Hokkaido Univ., Sapporo, Japan ; Kawaguchi, Y. ; Saitoh, K. ; Koshiba, M.

We present a novel design method and potential application for optical XOR, XNOR, NAND, and OR logic gates for binary-phase-shift-keyed signal processing devices. The devices are composed of multi-mode interference waveguides and convert the phase information of the input signal to amplitude at the output. We apply the finite element method for numerical simulations, and the evaluated least ON to OFF logic-level contrast ratios for the XOR, XNOR, NAND, and OR logic gates are 21.5 dB, 21.5 dB, 22.3 dB, and 22.3 dB, respectively. The proposed logic gates are extremely promising signal processing devices for binary-phase-shift-keyed signals in packet switching systems.

Published in:

Lightwave Technology, Journal of  (Volume:29 ,  Issue: 18 )

Date of Publication:

Sept.15, 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.