Cart (Loading....) | Create Account
Close category search window

A Model for Large Deflections of Nanobeams and Experimental Comparison

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Sapsathiarn, Y. ; Fac. of Appl. Sci., Simon Fraser Univ., Burnaby, BC, Canada ; Rajapakse, R.K.N.D.

Bending tests are commonly used for characterization of materials at the nanoscale. Beams are also key elements of nanomechanical and nanoelectromechanical devices. This paper is motivated by recent experiments of large deflections of chromium cantilevers and modeling based on the classical large deflection beam theory to simulate experiments. A review of nanobeam experiments shows complex size dependency of elastic modulus that is influenced by beam thickness (or diameter) and end boundary conditions. A new large deflection beam model that accounts for surface energy effects is presented. It is shown that the model is capable of simulating experiments by using size-independent properties such as bulk elastic modulus and surface residual stress. The model is then used to explain the softening or stiffening behavior observed experimentally in nanocantilevers and relative size independence of clamped-clamped beams. Size dependence of elastic modulus (or stiffening/softening) is a modeling artifact introduced due to the use of classical elasticity theory for nanostructures and the current model shows that simulations based on classical beam theory require careful interpretation.

Published in:

Nanotechnology, IEEE Transactions on  (Volume:11 ,  Issue: 2 )

Date of Publication:

March 2012

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.