Cart (Loading....) | Create Account
Close category search window
 

Quantifying the defect-dominated size effect of fracture strain in single crystalline ZnO nanowires

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
He, Mo-Rigen ; Beijing National Center for Electron Microscopy, Laboratory of Advanced Materials, Department of Materials Science and Engineering, Tsinghua University, Beijing 100084, People’s Republic of China ; Xiao, Pan ; Zhao, Jiong ; Dai, Sheng
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3594655 

The diameter (D) dependence of fracture strains in [0001]-oriented single crystalline ZnO nanowires (NWs) with D ranging from 18 to 114 nm is experimentally revealed via in situ uniaxial tension and is well understood based on an analytical model developed by combining molecular dynamics simulations with fracture mechanics theories. We show that the scattered fracture strains are dominated by the effective quantities of atomic vacancies, and their lower bound follows a power-form scaling law, resembling the Griffith-type behavior of single critical defects with diameter-dependent sizes, when D is larger than a critical DC. In addition, theoretical strength is expected in NWs with D < DC. Our studies provide a simple, but basic, understanding for the size effect of strengths in single crystalline NWs.

Published in:

Journal of Applied Physics  (Volume:109 ,  Issue: 12 )

Date of Publication:

Jun 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.