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Space charge characterization by the pressure pulse method in ion-irradiated polyimide films

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4 Author(s)
Cals, M.P. ; Office Nat. d''Etudes et de Recherches Aerospatiales, Chatillon, France ; Costantini, J.M. ; Issac, F. ; Marque, J.P.

The Pressure Pulse Method allows in situ measurements of charge build-up and evolution in heavy ion irradiated Kapton samples with a good signal to noise ratio. Space charge is detected in films with a thickness to range ratio larger or lower than one; in the latter case, ions are crossing throughout the material but a residual charge can be detected. The mean projected range in a thick sample, <rp>, is determined with good accuracy at low fluence

Published in:

Electrical Insulation and Dielectric Phenomena, 1994., IEEE 1994 Annual Report., Conference on

Date of Conference:

23-26 Oct 1994