By Topic

An “edge-on” silicon strip detector for X-ray imaging

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

17 Author(s)
Arfelli, F. ; Dipartimento di Fisica, Trieste Univ., Italy ; Barbiellini, G. ; Bonvicini, V. ; Bravin, A.
more authors

A silicon strip detector for the SYRMEP (SYncrotron Radiation for MEdical Physics) experiment has been designed and realised. The main features of this detector are AC-coupling through integrated coupling capacitors, DC biasing by means of a gated punch-through structure, bulk contact on the junction side through a forward-biased p+ implant and integrated fan-in on active silicon. Results of laboratory tests of the detector parameters, allowing a thorough evaluation of the technological solutions employed, are presented. The functionality of the detectors and the charge collection linearity have been tested with different γ sources, using a hybrid, low-noise front-end electronics

Published in:

Nuclear Science Symposium, 1996. Conference Record., 1996 IEEE  (Volume:1 )

Date of Conference:

2-9 Nov 1996