A new efficient transient noise analysis technique for simulation of CCD image sensors or particle detectors

A novel noise simulation technique for transient analysis is presented. This approach has been implemented in the electrical circuit simulator ELDO and is particularly useful for noise simulation in analog sampling circuits such as CCD (charge coupled device) image sensors or switched-capacitor circuits. Noise sources can be introduced into macromodels, and switched-capacitor filters or even sigma-delta modulators can be simulated without consuming too much CPU (central processing unit) time. Comparison between simulations and experimental results has been made and is shown for a 1.5-/spl mu/ CMOS current mode amplifier designed for high-rate particle detectors.