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Five-element Johann-type x-ray emission spectrometer with a single-photon-counting pixel detector

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11 Author(s)
Kleymenov, Evgeny ; Paul Scherrer Institut, 5232 Villigen, Switzerland ; van Bokhoven, Jeroen A. ; David, Christian ; Glatzel, Pieter
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Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3600452 

A Johann-type spectrometer with five spherically bent crystals and a pixel detector was constructed for a range of hard x-ray photon-in photon-out synchrotron techniques, covering a Bragg-angle range of 60°–88°. The spectrometer provides a sub emission line width energy resolution from sub-eV to a few eV and precise energy calibration, better than 1.5 eV for the full range of Bragg angles. The use of a pixel detector allows fast and easy optimization of the signal-to-background ratio. A concentration detection limit below 0.4 wt% was reached at the Cu Kα1 line. The spectrometer is designed as a modular mobile device for easy integration in a multi-purpose hard x-ray synchrotron beamline, such as the SuperXAS beamline at the Swiss Light Source.

Published in:

Review of Scientific Instruments  (Volume:82 ,  Issue: 6 )

Date of Publication:

Jun 2011

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