By Topic

Colour based road sign detection and extraction from still images

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Malik, R. ; Dept. of Comput. Sci., NUST, Rawalpindi, Pakistan ; Nazir, S. ; Khurshid, J.

This paper presents a system for the detection of road signs from a road scene image and extracts the pictogram inside the sign. The detection is carried out on basis of colour information of road signs instead of edge information from grayscale images. The presented colour based detection process is invariant to the common problems in road signs i.e. shadow, highlight and general affine transformation and rotation. However owing to the problems addressed in the process, it can be stated that the colour information alone is inadequate for segmentation process. Using some edge based segmentation methodology alongside would increase the detection process' performance. The idea presented in the paper is through detection of road signs with red boundaries and white interior containing black pictograms. More colours with thresholds and shapes with their Hue moments can be added without any change in the general detection methodology; colour segmentation and shape analysis. HSV colour space is adopted for colour segmentation which makes detection invariable to high-lights and illumination changes. While affine moments are used for shape analysis, which makes it invariant to rotation and scale.

Published in:

Cybernetic Intelligent Systems (CIS), 2010 IEEE 9th International Conference on

Date of Conference:

1-2 Sept. 2010