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A statistical method for the analysis of CMOS process fluctuations on dynamic performance

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5 Author(s)
de Almeida, M. ; Aerospatiale, Suresnes, France ; Regnier, X. ; Daga, J.M. ; Robert, M.
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This paper describes the efforts of the Aerospatiale Joint Research Center in the development of a statistical method to assess the influence of CMOS process fluctuations on ASIC dynamic performance. After a brief description of our ASIC problematic, each step of the proposed method is presented. Then, the software working environment is described as well as simulation models. The first results obtained for ring oscillators by our method are compared to silicon measurements and finally, the benefits and restrictions of the method are discussed

Published in:

Microelectronic Test Structures, 1997. ICMTS 1997. Proceedings. IEEE International Conference on

Date of Conference:

17-20 Mar 1997