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Measurement of mode field profiles and bending and transition losses in curved optical channel waveguides

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4 Author(s)
Subramaniam, V. ; Dept. of Electr. & Comput. Eng., Cincinnati Univ., OH, USA ; De Brabander, Gregory N. ; Naghski, David H. ; Boyd, Joseph T.

Curved, single-mode, silicon oxynitride optical ridge channel waveguides have been characterized by measuring mode field profile alteration, bending loss, and transition loss. The results were compared to theoretical calculations. Near field imaging of the channel mode field profiles showed the effect of bend radius on mode shape. Good agreement was obtained between the measurements and profiles obtained from two-dimensional (2-D) beam propagation method calculations. The exponential dependence of bending loss on bend radius and the variation of transition loss on the lateral offset between channels having different bend radius were successfully modeled by two simple theories

Published in:

Lightwave Technology, Journal of  (Volume:15 ,  Issue: 6 )

Date of Publication:

Jun 1997

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