Cart (Loading....) | Create Account
Close category search window
 

An industrial strength theorem prover for a logic based on Common Lisp

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Kaufmann, M. ; Motorola Inc., Austin, TX, USA ; Moore, J.S.

ACL2 is a reimplemented extended version of R.S. Boyer and J.S. Moore's (1979; 1988) Nqthm and M. Kaufmann's (1988) Pc-Nqthm, intended for large scale verification projects. The paper deals primarily with how we scaled up Nqthm's logic to an industrial strength” programming language-namely, a large applicative subset of Common Lisp-while preserving the use of total functions within the logic. This makes it possible to run formal models efficiently while keeping the logic simple. We enumerate many other important features of ACL2 and we briefly summarize two industrial applications: a model of the Motorola CAP digital signal processing chip and the proof of the correctness of the kernel of the floating point division algorithm on the AMD5K 86 microprocessor by Advanced Micro Devices, Inc

Published in:

Software Engineering, IEEE Transactions on  (Volume:23 ,  Issue: 4 )

Date of Publication:

Apr 1997

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.