Cart (Loading....) | Create Account
Close category search window
 

Fractal modeling of mammogram and enhancement of microcalcifications

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Li, H. ; Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA ; Liu, K.J.R. ; Lo, S.C.B.

According to the theory of deterministic fractal geometry, images can be modeled by deterministic fractal objects which are attractors of sets of two dimensional affine transformations. In this paper, a fractal modeling approach is developed to analyze and model mammographic breast tissue background. We show that general mammographic parenchymal and ductal patterns can be well modeled by a set of parameters of affine transformations. Therefore, microcalcifications can be enhanced by taking the difference between the original image and the modeled image. Our results are compared with those of the partial wavelet reconstruction and morphological operation approaches. The evaluation results demonstrate that the fractal modeling method is an effective way to enhance microcalcifications, and thereby may facilitate the radiologists' diagnosis. It may also be able to improve the detection of microcalcifications in a computer system

Published in:

Nuclear Science Symposium, 1996. Conference Record., 1996 IEEE  (Volume:3 )

Date of Conference:

2-9 Nov 1996

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.