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BIST-Based Fault Diagnosis for Read-Only Memories

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4 Author(s)
Mukherjee, N. ; Mentor Graphics Corp., Wilsonville, OR, USA ; Pogiel, A. ; Rajski, J. ; Tyszer, J.

This paper presents a built-in self-test (BIST)-based scheme for fault diagnosis that can be used to identify permanent failures in embedded read-only memories. The proposed approach offers a simple test flow and does not require intensive interactions between a BIST controller and a tester. The scheme rests on partitioning of rows and columns of the memory array by employing low cost test logic. It is designed to meet requirements of at-speed test thus enabling detection of timing defects. Experimental results confirm high diagnostic accuracy of the proposed scheme and its time efficiency.

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:30 ,  Issue: 7 )

Date of Publication:

July 2011

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