By Topic

Interferometric Circular SAR Method for Three-Dimensional Imaging

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Yun Lin ; Nat. Key Lab. of Microwave Imaging Technol., Chinese Acad. of Sci., Beijing, China ; Wen Hong ; Weixian Tan ; Yanping Wang
more authors

The aperture of 360° gives circular synthetic aperture radar (SAR) (CSAR) the capability to detect hidden target when its orientation is unknown. Subwavelength resolution can also be achieved when the target in the spotted area is observed under a complete circular aperture. Furthermore, the aspect angle diversity inherent to the circular trajectory makes possible a 3-D target reconstruction. However, the latter two potentials require certain target reflectivity homogeneity. For a highly directive scatterer, it has no resolving ability in the direction normal to the data collection plane. In this letter, a new interferometric CSAR method is presented to enhance the tomographic imaging capability for highly directive scatterers without sacrificing other scatterers' resolutions. This method takes advantage of the coherence and the phase difference between a pair of 3-D SAR images formed from data collected at two separate circular apertures to eliminate targets that focused at a wrong elevation. In addition, it uses two different transmit frequencies to solve the problem of phase cycle ambiguities. Finally, simulation results validate this new approach.

Published in:

Geoscience and Remote Sensing Letters, IEEE  (Volume:8 ,  Issue: 6 )