Cart (Loading....) | Create Account
Close category search window
 

Study of GEM-foil defects with optical scanning system

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Kalliokoski, M. ; Helsinki Inst. of Phys., Univ. of Helsinki, Helsinki, Finland ; Hilden, T. ; Garcia, F. ; Lauhakangas, R.
more authors

Deformations can build up in the production stages of the GEM-foils. They can affect the performance of the foils and reduce the lifetime of the detector. With an optical scanning system that we have obtained and developed to improve our quality control system for GEM-detector construction we can locate and study different types of defects on the GEM-foils. We studied standard 100 mm × 100 mm GEM-foils by assembling them as a single-GEM detector with XY-readout and irradiated the areas with defects with X-rays from 55Fe source. In this paper we present the results of these measurements.

Published in:

Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE

Date of Conference:

Oct. 30 2010-Nov. 6 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.