By Topic

Crystal growth and scintillation properties of Nd-doped Lu3Al5O12 single crystals

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
M. Sugiyama ; Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai Miyagi 980-8577, Japan ; Y. Fujimoto ; T. Yanagida ; Y. Yokota
more authors

Scintillation properties of Nd-doped Lu3Al5O12 (Nd:LuAG) single crystals grown by the micro-pulling down (μ-PD) method have been studied. The Nd concentration ranged from 0.1 to 3 mol%. The grown crystals were transparent and had a single-phase confirmed by powder XRD measurements. In transmittance spectra, they showed about 80% transmittance down to 300 nm and some weak 4f-4f absorption lines appeared. They showed broad emission peaks due to defects in the host and some sharp peaks due to Nd3+ 4f-4f transitions in radioluminescence spectra under 241Am α-ray excitation. Their γ-ray-excited decay time profiles consisted of two components as 340-760 ns and 3-5 μs. Among them, Nd 0.5%:LuAG exhibited the highest light yield under 137Cs 662 keV excitation and the absolute light yield of this sample was estimated to be 7600 ±760 photons/MeV.

Published in:

IEEE Nuclear Science Symposuim & Medical Imaging Conference

Date of Conference:

Oct. 30 2010-Nov. 6 2010