Cart (Loading....) | Create Account
Close category search window
 

Simulated fault injection: a methodology to evaluate fault tolerant microprocessor architectures

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Choi, G.S. ; Illinois Univ., Urbana-Champaign, IL, USA ; Iyer, R.K. ; Carreno, V.A.

A simulation-based fault-injection methodology for validating fault-tolerant microprocessor architectures is described. The approach uses mixed-mode simulation (electrical/logic analysis), and injects transient errors in run-time to assess the resulting fault-impact. To exemplify the methodology, a fault-tolerant architecture which models the digital aspects of a dual-channel, real-time jet-engine controller is used. The level of effectiveness of the dual configuration with respect to single and multiple transients is measured. The results indicate 100% coverage of single transients. Approximately 12% of the multiple transients affect both channels; none result in controller failure since two additional levels of redundancy exist

Published in:

Reliability, IEEE Transactions on  (Volume:39 ,  Issue: 4 )

Date of Publication:

Oct 1990

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.