Development of a microprocessor-based four probe DC resistivity setup for T/sub c/ measurement of superconducting materials

The design of a microprocessor-based resistivity measurement system for high transition temperature (T/sub c/) superconducting materials is described. This design includes interfacing an Intel 8085 microprocessor system with an IBM-compatible personal computer (PC) through RS-232C serial communication. This design is used to measure resistivity for superconducting samples of YBa/sub 2/Cu/sub 3/O/sub 7-x/ and strontium/potassium substituted YBa/sub 2/Cu/sub 3/O/sub 7-x/. A correction method is described for the parameters whose values are changing throughout the measurement period to minimize the measurement errors.<
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