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Development of a microprocessor-based four probe DC resistivity setup for Tc measurement of superconducting materials

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4 Author(s)
Pragasam, R. ; Dept. of Phys., Indian Inst. of Technol., Madras, India ; Murthy, V.R.K. ; Viswanathan, B. ; Natarajan, T.S.

The design of a microprocessor-based resistivity measurement system for high transition temperature (Tc) superconducting materials is described. This design includes interfacing an Intel 8085 microprocessor system with an IBM-compatible personal computer (PC) through RS-232C serial communication. This design is used to measure resistivity for superconducting samples of YBa2Cu 3O7-x and strontium/potassium substituted YBa2Cu3O7-x. A correction method is described for the parameters whose values are changing throughout the measurement period to minimize the measurement errors

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Instrumentation and Measurement, IEEE Transactions on  (Volume:39 ,  Issue: 5 )