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A new optical wavelength ratio measurement apparatus: the fringe counting sigmameter

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5 Author(s)
Juncar, P.P. ; Bureau Nat. de Metrologie, Inst. Nat. de Metrologie, Paris, France ; Elandaloussi, H. ; Himbert, M.E. ; Pinard, J.
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A new, compact and achromatic Michelson-type interferometer with a variable path difference is presented. This “fringe-counting” sigmameter allows measurement of optical wavelength ratios between a laser of unknown wavelength and a reference laser of known wavelength. This apparatus, maintained in a vacuum, measures interference order variations in two stages: integer counting of around 400000 and fractional counting (also called “excess fraction”) with an uncertainty of 10-3. From these measurements, this “sigmameter” can determine laser wavelength from 0.36 μm to 1.5 μm with an accuracy of 1.10-8 using a reference stabilized He-Ne laser

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:46 ,  Issue: 3 )

Date of Publication:

Jun 1997

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