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Efficiency improvement in charge pump circuits

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2 Author(s)
Chi-Chang Wang ; Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan ; Jiin-Chuan Wu

Conventional charge pump circuits use a fixed switching frequency that leads to power efficiency degradation for loading less than the rated loading. This paper proposes a level shifter design that also functions as a frequency converter to automatically vary the switching frequency of a dual charge pump circuit according to the loading. The switching frequency is designed to be 25 kHz with 12 mA loading on both inverting and noninverting outputs. The switching frequency is automatically reduced when loading is lighter to improve the power efficiency. The frequency tuning range of this circuit is designed to be from 100 Hz to 25 kHz. A start-up circuit is included to ensure proper pumping action and avoid latch-up during power-up. A slow turn-on, fast turn-off driving scheme is used in the clock buffer to reduce power dissipation. The new dual charge pump circuit was fabricated in a 3-μm p-well double-poly single-metal CMOS technology with breakdown voltage of 18 V, the die size is 4.7×4.5 mm2. For comparison, a charge pump circuit with conventional level shifter and clock buffer was also fabricated. The measured results show that the new charge pump has two advantages: (1) the power dissipation of the charge pump is improved by a factor of 32 at no load and by 2% at rated loading of 500 Ω and (2) the breakdown voltage requirement is reduced from 19.2 to 17 V

Published in:

Solid-State Circuits, IEEE Journal of  (Volume:32 ,  Issue: 6 )

Date of Publication:

Jun 1997

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