Cart (Loading....) | Create Account
Close category search window
 

Berger check prediction for concurrent error detection in the Braun array multiplier

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Jones, C.M. ; Dept. of Electr. & Electron. Eng., Newcastle upon Tyne Univ., UK ; Dlay, S.S. ; Naguib, R.G.

We develop the Berger Check Symbol Prediction and report the performance benefit for the realisation of practical concurrent error detection systems. Furthermore, we show that the Berger coded Braun array multiplier can not only achieve the objective for detecting unidirectional faults but analysis has indicated an inherent ability of this prediction technique for error detection beyond the scope for which it was originally intended. In fact the coding provides error detectability for single and multiple stuck at faults. Further study suggests the performance of the Berger check prediction Braun array multiplier tends towards 100% error detectability for increasing input bit length and array dimensions. The Berger check predictive Braun array multiplier has introduced a high level of concurrent error detectability with only a minimal extension in the hardware implementation

Published in:

Electronics, Circuits, and Systems, 1996. ICECS '96., Proceedings of the Third IEEE International Conference on  (Volume:1 )

Date of Conference:

13-16 Oct 1996

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.