Cart (Loading....) | Create Account
Close category search window
 

Analysis of electromagnetic wave propagation considering continuity of polarization current by using vector facet elements

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Shirakawa, S. ; Res. Lab., Hitachi Ltd., Ibaraki, Japan ; Fukumoto, H.

A method for calculating the electromagnetic wave propagation considering continuity of polarization current is presented. An electric field integral equation is used along with the moment method to develop an efficient procedure for numerical analysis of thin dielectric slabs such as the printed circuit boards (PCBs). In order to accurately treat the polarization charge and current conditions, the basic function of facet elements is used, by which it is possible for divergence of polarization current in a subdivided volume element to be exactly zero. The internal electric field of the dielectric sphere agrees with the theoretical value. The calculated impedance characteristic of the PCBs is in good agreement with prediction of the patch antenna theory

Published in:

Magnetics, IEEE Transactions on  (Volume:33 ,  Issue: 2 )

Date of Publication:

Mar 1997

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.