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A probabilistic explanation of dark line features observed in images with speckle

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1 Author(s)
Hirosawa, H. ; Inst. of Space & Astronaut. Sci., Kanagawa, Japan

A probabilistic explanation is given to randomly-distributed, dark curved-line patterns which the authors observe in images with speckle, such as in one-look synthetic aperture radar images. Also it is shown that multi-look processing weakens the appearance of such line features

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Geoscience and Remote Sensing, IEEE Transactions on  (Volume:35 ,  Issue: 3 )