Cart (Loading....) | Create Account
Close category search window

Dynamic statistical control of manufacturing test

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Ghosh, S.P. ; IBM Almaden Res. Center, San Jose, CA, USA ; Grochowski, E.G.

A method for controlling manufacturing tests in real time by statistically predicting test behavior is described. This statistical prediction is used to eliminate certain tests in sequential testing. Analytic methods for clustering tests for more efficient execution and an algorithm for predictive testing are presented. A relational database using structured-query-language system, called SQL/DB2 is proposed; its structure allows efficient retrieval of the information needed for test prediction, test clustering, and predictive testing. A test-system architecture based on personal computers is presented.<>

Published in:

Design & Test of Computers, IEEE  (Volume:7 ,  Issue: 4 )

Date of Publication:

Aug. 1990

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.