Referenced Items are not available for this document.
In a totally self-checking (TSC) design, the circuit detects errors by monitoring redundantly coded data/control paths through a TSC checker. A problem arises when not all these code words are on the monitored lines during normal operation. A method of designing checkers that solves this difficulty is proposed. The method uses TSC checkers based on flip-flops instead of using the mostly combinational checkers now available. Two design applications are presented: TSC checkers for arithmetic AN codes, and a TSC iterative logic array.<
Published in:
Design & Test of Computers, IEEE
(Volume:7
,
Issue:
4
)
Date of Publication: Aug. 1990
- Page(s):
- 5 - 12
- ISSN :
- 0740-7475
- INSPEC Accession Number:
- 3757761
- Digital Object Identifier :
- 10.1109/54.57909
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 06 August 2002
- Issue Date :
- Aug. 1990
- Sponsored by :
- IEEE Council on Electronic Design and Automation
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