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NBTI-aware statistical timing analysis framework

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2 Author(s)
Sangwoo Han ; Dept. of Comput. Sci. & Eng., Sogang Univ., Seoul, South Korea ; Juho Kim

Negative bias temperature instability (NBTI) has become a major factor of reliability. In this paper, we proposed a simple analytical model to predict the degraded delay distribution due to NBTI and process variation. Using our NBTI and variation-aware timing analysis framework, accurate degraded gate delay is computed without tedious simulation. Moreover, conventional variation-aware design techniques can apply to develop a reliable circuit design using our model.

Published in:

SOC Conference (SOCC), 2010 IEEE International

Date of Conference:

27-29 Sept. 2010