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A novel and low-cost method to detect delay variation by dynamic thermal laser stimulation

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8 Author(s)
Chunlei Wu ; Product Analysis Laboratory, Freescale Semiconductor (China) Limited, Tianjin, China ; Masuda Motohiko ; Winter Wang ; Grace Song
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Delay variation can be very difficult to localize in function failure analysis. In this paper we combine Delay Variation Mapping (DVM) and Soft Defect Localization (SDL) to develop a novel and low-cost method that can detect delay variation effectively. It just uses Static Thermal Laser Stimulation (S-TLS), Oscilloscope and Function Generator to compose a dynamic thermal laser stimulation (D-TLS) system. The methodology, system configuration and experimental results of this method are presented.

Published in:

Reliability Physics Symposium (IRPS), 2011 IEEE International

Date of Conference:

10-14 April 2011