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Delay variation can be very difficult to localize in function failure analysis. In this paper we combine Delay Variation Mapping (DVM) and Soft Defect Localization (SDL) to develop a novel and low-cost method that can detect delay variation effectively. It just uses Static Thermal Laser Stimulation (S-TLS), Oscilloscope and Function Generator to compose a dynamic thermal laser stimulation (D-TLS) system. The methodology, system configuration and experimental results of this method are presented.