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A rotation-based BIST with self-feedback logic to achieve complete fault coverage

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4 Author(s)
Wei-Cheng Lien ; Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan ; Tong-Yu Hsieh ; Cheng-Tsung Tsai ; Kuen-Jong Lee

This paper presents a deterministic BIST technique that can efficiently achieve complete fault coverage without using any storage devices. A novel test structure containing a self-feedback logic unit and a circular shift register is proposed by which all the required deterministic patterns can be generated on-chip in real time. Experiments on ISCAS 85 benchmark circuits show that compared with previous work addressing the same problem our technique requires much less test time to achieve 100% fault coverage for all testable stuck-at faults.

Published in:

VLSI Design, Automation and Test (VLSI-DAT), 2011 International Symposium on

Date of Conference:

25-28 April 2011