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Technology scaling: A system perspective

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A collection of slides from the author's conference presentation is given. The following topics are discussed: VLSI design, automation & test; technology scaling; Moore's law; platform segment characteristics; dynamic platform control; dynamic adaptation & reconfiguration; resilient platforms; voltage-frequency range limiters; voltage-frequency margins; fine-grain power management; voltage regulators; reconfigurable accelerators; platform interconnects; energy efficient interconnects; many-core research testchip; many-core power management; variation-aware core-mapping; core-to-core variations; optimal core-mapping; dynamic thread-hopping; dynamic multi-voltage cache; cache reconfiguration; low-voltage motion estimation engine; dynamic V&F adaptation; resilient circuits; resilient & adaptive core; performance & efficiency gains; and adaptive clock control.

Published in:

VLSI Design, Automation and Test (VLSI-DAT), 2011 International Symposium on

Date of Conference:

25-28 April 2011