By Topic

The integrated methodology of pattern-based enterprise application development and maintenance

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Sergey V. Zykov ; State University - Higher School of Economics, Moscow Russia

The problem of building and maintaining distributed large-scale software applications is really a serious challenge. The processes concerned are hampered by the avalanche of bulky data, which is heterogeneous in structure and architecture. Therewith, an integral methodological approach (which includes not only CASE-level software and technologies, but also rigorous and uniform mathematical models) is required to conquer the complexity and challenges. The approach embraces the entire enterprise software development lifecycle. The methodology suggested simplifies system maintenance due to component-level metadata pattern management, which increase high artifacts reuse, and easily adapt to changeable business requirements. The paper presents the approach outline, and discusses a number of successful implementations based on the pattern management methodology.

Published in:

Software Engineering Conference (CEE-SECR), 2010 6th Central and Eastern European

Date of Conference:

13-15 Oct. 2010