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A new hierarchical built-in self-test with on-chip diagnosis for VLIW processors

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4 Author(s)
Markus Ulbricht ; Computer Engineering Group, Brandenburg University of Technology, Cottbus, Germany ; Mario Schölzel ; Tobias Koal ; Heinrich Theodor Vierhaus

This paper presents a new in-the-field self-test approach for a specific VLIW processor model with emphasis on the diagnostic capability of the test. It is intended to be used as start-up test in-the-field in order to localize permanently defect components in a VLIW processor model, which provides self-repair capability. In order to overcome the drawbacks of several existing self-test techniques, a combination of them in a hierarchical manner is provided. By this, the data path of the VLIW processor can be checked within a very short time and at a fine grained diagnostic level. The results show that the required diagnostic resolution for the used processor model with self-repair capability can be obtained with a relatively small hardware overhead of about 6%.

Published in:

Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011 IEEE 14th International Symposium on

Date of Conference:

13-15 April 2011