By Topic

A new hierarchical built-in self-test with on-chip diagnosis for VLIW processors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Ulbricht, M. ; Comput. Eng. Group, Brandenburg Univ. of Technol., Cottbus, Germany ; Scholzel, M. ; Koal, T. ; Vierhaus, H.T.

This paper presents a new in-the-field self-test approach for a specific VLIW processor model with emphasis on the diagnostic capability of the test. It is intended to be used as start-up test in-the-field in order to localize permanently defect components in a VLIW processor model, which provides self-repair capability. In order to overcome the drawbacks of several existing self-test techniques, a combination of them in a hierarchical manner is provided. By this, the data path of the VLIW processor can be checked within a very short time and at a fine grained diagnostic level. The results show that the required diagnostic resolution for the used processor model with self-repair capability can be obtained with a relatively small hardware overhead of about 6%.

Published in:

Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011 IEEE 14th International Symposium on

Date of Conference:

13-15 April 2011