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The origins of image contrast in SEAM of ferroelectric semiconductor, ceramics and single crystal: BaTiO3

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4 Author(s)
Bingyang Zhang ; Inst. of Ceramics, Acad. Sinica, Shanghai, China ; Yang Yang ; Jiang, Fuming ; Qingrui Yin

A relatively new imaging technique, scanning electron-acoustic microscope (SEAM), was used to investigate the ferroelectric semiconductors, ferroelectric ceramics and single crystal: BaTiO3 . The subsurface defects of ferroelectric semiconductors and the domain structures of ferroelectric ceramics and single crystal were observed without any pre-handling to the samples in the electron-acoustic imaging of these materials. The origins of image contrast in SEAM of these materials have been discussed based on differently experimental conditions

Published in:

Electrets, 1996. (ISE 9), 9th International Symposium on

Date of Conference:

25-30 Sep 1996