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Browse Journals & Magazines > Electronics Letters ...> Volume:47 Issue:11 Help

Spatially resolved loss measurement in silicon waveguides using optical frequency-domain reflectometry

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3 Author(s)
Müller, J. ; E-11 Optische Kommunikationstechnik, Tech. Univ. Hamburg-Harburg, Hamburg, Germany ; Krause, M. ; Brinkmeyer, E.

Spatially resolved determination of loss in silicon nanophotonic waveguides using optical frequency-domain reflectometry is reported. Taking measurements from either side of a waveguide, discriminating loss from non-uniform scattering properties is demonstrated. This technique is fast, nondestructive and does not require any knowledge about the launching efficiency.

Published in:
Electronics Letters  (Volume:47 ,  Issue: 11 )

Date of Publication: May 26 2011

Page(s):
668 - 670
ISSN :
0013-5194
INSPEC Accession Number:
12108554
Digital Object Identifier :
10.1049/el.2011.0939
Product Type:
Journals & Magazines
Date of Current Version :
11 August 2011
Issue Date :
May 26 2011
Sponsored by :
Institution of Engineering and Technology

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