By Topic

A problem independent parallel implementation of simulated annealing: models and experiments

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Roussel-Ragot, P. ; Lab. d''Electron., Ecole Superieure de Phys. et de Chimie Ind. de la Ville de Paris, France ; Dreyfus, G.

The proposed implementation is guaranteed to exhibit the same convergence behavior as the serial algorithm. Two models of parallelization, depending on the value of the temperature, are introduced and statistical models which can predict the speedup for any problem (as a function of the acceptance rate and of the number of processors), are derived. The performances are evaluated on a simple placement problem with a transputer-based network, and the models are compared with experiments

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:9 ,  Issue: 8 )