By Topic

A Comparative Study of 20-Gb/s NRZ and Duobinary Signaling Using Statistical Analysis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Kangmin Hu ; Sch. of Electr. Eng. & Comput. Sci., Oregon State Univ., Corvallis, OR, USA ; Larry Wu ; Patrick Yin Chiang

A statistical analysis technique for estimating bit-error rate (BER) and eye opening is presented for both non-return-to-zero (NRZ) and duobinary signaling schemes. This method enables fast and accurate BER distribution simulation of a serial link transceiver including channel and circuit imperfections, such as finite pulse rise/fall time, duty cycle variation and both receiver and transmitter forwarded-clock jitter. A comparison between 20-Gb/s NRZ and duobinary transmitters using this simulator shows that while duobinary transmission relaxes the requirements on the receiver equalizer due to the lower Nyquist frequency of the transmitted data, significant eye-opening and BER degradation can arise from clock non-idealities. The proposed statistical analysis is verified against traditional time-domain, transient eye-diagram simulations at 20-Gb/s, transmitted through measured s-parameter channel characteristics.

Published in:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems  (Volume:20 ,  Issue: 7 )