Cart (Loading....) | Create Account
Close category search window
 

Towards Agile Testing of Exceptional Behavior

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Di Bernardo, R. ; Inf. Center, Fed. Univ. of Pernambuco, Recife, Brazil ; Castor, F. ; Soares, S.

Many of the problems found in the uses of exception handling are caused by the lack of testing and a priori design of the exceptional behavior. As a consequence, exceptions flow in unforeseen ways during the execution of a software system, causing a negative impact on reliability. This paper presents a new agile approach to test the exceptional behavior of a system. It supports developers in checking whether exceptions, at runtime, travel through the expected paths. It is agile because tests are written without the need for extra documentation. We present a preliminary evaluation of the proposed approach, where it helped us to uncover four bugs in a production system, two of them previously unknown. We have implemented the proposed approach as an extension of the JUnit framework.

Published in:

Dependable Computing Workshops (LADCW), 2011 Fifth Latin-American Symposium on

Date of Conference:

25-29 April 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.