Cart (Loading....) | Create Account
Close category search window

Device characterization of correlated electron random access memories

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
McWilliams, Christopher R. ; Symetrix Corporation, 5055 Mark Dabling Boulevard, Colorado Springs, Colorado 80918, USA ; Celinska, Jolanta ; Paz de Araujo, Carlos A. ; Xue, Kan-Hao

Your organization might have access to this article on the publisher's site. To check, click on this link: 

The switching properties and characterization of correlated electron random Access Memories (CeRAMs) are described herein. High temperature retention, cycle dispersion and optimization, cycle Fatigue, and switching parameter optimization have been investigated. CeRAM’s display initially conductive or “born-ON” behavior without the need for the high electroforming voltages usually required for other transition metal oxide based resistive memories. Nonvolatile data retention at elevated temperatures up to 573 K (300 °C) in addition to a wide operating range from 4 to 423 K for CeRAM has been confirmed. CeRAMs also show exceptional read endurance with no evidence of fatigue out to 1012 cycles. Desirable scaling characteristics for high density memory application have also been shown for CeRAMs due to a widening of the read window and consistent write window as devices are scaled down.

Published in:

Journal of Applied Physics  (Volume:109 ,  Issue: 9 )

Date of Publication:

May 2011

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.