By Topic

Vision based cross sectional area estimator for industrial rubber profile extrusion process controlling

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Karunasena, C. ; Department of Mechanical and Manufacturing Engineering, Faculty of Engineering, University of Ruhuna, Hapugala, Galle, Sri Lanka +94 ; Wickramarachchi, N.

This paper presents a vision based cross sectional area measurement system suitable for in-process quality controlling of rubber profile extrusions via cross section measurements. The system is basically developed for solid trapezoidal shaped rubber profiles commonly used in the rubber tack manufacturing industry. Since the extrusion continuously comes out the extruder, it is impossible to view the cross section directly. So in the proposed system, a laser projected at an angle on to the profile is used which is finally observed by a camera. Laser projections seen in each camera image is processed in a general purpose note book computer by the use of a vision software to estimate the cross section area of the actual profile. The paper contains the development approach of the method, experimental results and further improvement tips. Several test results are also presented in order to give an idea of the system accuracy and repeatability. The technology with further developments can be used as closed loop feedbacks for efficient process controlling of rubber profile extruders.

Note: This article was mistakenly omitted from the original IEEE Xplore conference submission.  

Published in:

Information and Automation for Sustainability (ICIAFs), 2010 5th International Conference on

Date of Conference:

17-19 Dec. 2010