Cart (Loading....) | Create Account
Close category search window

A CMOS-Based ISFET Chemical Imager With Auto-Calibration Capability

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Goh, C.Z.D. ; Dept. of Bioeng., Imperial Coll. London, London, UK ; Georgiou, P. ; Constandinou, T.G. ; Prodromakis, T.
more authors

This paper presents a novel auto-calibration technique for eliminating sensor mismatch in CMOS-based chemical imagers. Designed using an 8 × 8 array comprising of pH-sensitive ion-sensitive field-effect transistors (ISFETs), the chemical imager is capable of implementing a gradient-based calibration algorithm by biasing programmable-gate (PG) ISFETs at a common operating point when exposed to a solution of homogenous pH. The system was fabricated in a typical 0.35-μm CMOS technology and demonstrated a fast rate of convergence (500 ms per iteration) while a convergence accuracy of 45 mV on a gain of 10 (0.5% relative standard error and 2% pixel-to-pixel variation) was achieved. A maximum pH sensitivity of 57 mV/pH is also reported.

Published in:

Sensors Journal, IEEE  (Volume:11 ,  Issue: 12 )

Date of Publication:

Dec. 2011

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.