By Topic

Inference of k-testable languages in the strict sense and application to syntactic pattern recognition

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
García, P. ; Dept. de Sistemas Inf. y Comput., Univ. Politecnica de Valencia, Spain ; Vidal, E.

The inductive inference of the class of k-testable languages in the strict sense (k-TSSL) is considered. A k -TSSL is essentially defined by a finite set of substrings of length k that are permitted to appear in the strings of the language. Given a positive sample R of strings of an unknown language, a deterministic finite-state automation that recognizes the smallest k-TSSL containing R is obtained. The inferred automation is shown to have a number of transitions bounded by O(m) where m is the number of substrings defining this k-TSSL, and the inference algorithm works in O(kn log m) where n is the sum of the lengths of all the strings in R. The proposed methods are illustrated through syntactic pattern recognition experiments in which a number of strings generated by ten given (source) non-k-TSSL grammars are used to infer ten k-TSSL stochastic automata, which are further used to classify new strings generated by the same source grammars. The results of these experiments are consistent with the theory and show the ability of (stochastic) k-TSSLs to approach other classes of regular languages

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:12 ,  Issue: 9 )