Close category search window
 

Large peak-to-valley ratio of negative-differential-conductance in graphene p-n junctions

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Nguyen, V.Hung ; Institut d’Electronique Fondamentale, UMR8622, CNRS, University Paris Sud, 91405 Orsay, France ; Bournel, A. ; Dollfus, P.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3587570 

We investigate the transport characteristics of monolayer graphene p-n junctions by means of the nonequilibrium Green’s function technique. It is shown that due to the high interband tunneling of chiral fermions and a finite bandgap opening when the inversion symmetry of the graphene plane is broken, a strong negative-differential-conductance behavior with a peak-to-valley ratio as large as a few tens can be achieved even at room temperature. The dependence of this behavior on the device parameters such as the Fermi energy, the barrier height, and the transition length is then discussed.

Published in:
Journal of Applied Physics  (Volume:109 ,  Issue: 9 )

Date of Publication: May 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.