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Multi-Pattern n -Detection Stuck-At Test Sets for Delay Defect Coverage

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1 Author(s)
Pomeranz, I. ; Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA

An n-detection test set detects each target fault n times. A higher value of n increases the likelihood that defects around the site of a target fault will be detected. However, an n -detection test set that consists of single-pattern tests (generated for single stuck-at faults) cannot guarantee that delay defects will be detected. For this it is necessary to use multi-pattern tests. The procedure described in this work generates a multi-pattern n-detection test set for single stuck-at faults. The procedure is applied starting from a single-pattern n-detection test set for single stuck-at faults. Experimental results demonstrate that the multi-pattern n-detection test set achieves a high transition fault coverage. It achieves a similar bridging fault coverage to the single-pattern test set. An added advantage is that the multi-pattern test set typically requires significantly fewer clock cycles for test application than the single-pattern test set.

Published in:

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on  (Volume:20 ,  Issue: 6 )

Date of Publication:

June 2012

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