Cart (Loading....) | Create Account
Close category search window
 

Exploration of radiated electromagnetic immunity of integrated circuits up to 40 GHz

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)

The effects of radiated electromagnetic injection on a digital integrated circuit up to 40 GHz are explored. The influence of several parameters (carrier frequency, pulse amplitude and duration) is highlighted and compared with available results from the literature on different technologies. Several electromagnetic immunity weaknesses are observed at a relatively low injection power. Finally, some explanations of these susceptibility phenomena are given.

Published in:

Electronics Letters  (Volume:47 ,  Issue: 10 )

Date of Publication:

May 12 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.