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An electrical test method for MEMS convective accelerometers: Development and evaluation

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5 Author(s)
Rekik, A.A. ; LIRMM, Univ. Montpellier 2, Montpellier, France ; Azais, F. ; Dumas, N. ; Mailly, F.
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In this paper, an alternative test method for MEMS convective accelerometers is presented. It is first demonstrated that device sensitivity can be determined without the use of physical test stimuli by simple electrical measurements. Using a previously developed behavioral model that allows efficient Monte-Carlo simulations, we have established a good correlation between electrical test parameters and device sensitivity. Proposed test method is finally evaluated for different strategies that privilege yield, fault coverage or test efficiency.

Published in:

Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011

Date of Conference:

14-18 March 2011

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