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A High-Reliability, Low-Power Magnetic Full Adder

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5 Author(s)
Yi Gang ; IEF, Univ. Paris-Sud, Orsay, France ; Weisheng Zhao ; Klein, J.-O. ; Chappert, C.
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Recently, ultra-low power circuits based on logic-in magnetic tunnel junction (MTJ) memory structure have been studied thanks to its non-volatility, infinite endurance, high access speed, and easy integration with CMOS process. However, this type of circuit suffers from low reliability both in memory cell and sensing amplifier circuits, which greatly limits its practical applications for logic computation. In this paper, we present a new design of magnetic full adder (MFA) to overcome this issue based on the thermally assisted switching (TAS) MTJ cell and pre-charge sensing amplifier (PCSA) circuit. By using CMOS 65 nm design kit and a precise TAS-MTJ model, mixed simulations have been performed to demonstrate its high reliability keeping low power and small die area.

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Magnetics, IEEE Transactions on  (Volume:47 ,  Issue: 11 )